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Influence of carrier concentration on properties of InAs waveguide layers in interband cascade laser structures

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dc.contributor.authorDyksik, M
dc.contributor.authorMotyka, M
dc.contributor.authorSęk, G
dc.contributor.authorMisiewicz, J
dc.contributor.authorDallner, M
dc.contributor.authorHoefling, Sven
dc.contributor.authorKamp, M
dc.date.accessioned2016-07-27T08:30:11Z
dc.date.available2016-07-27T08:30:11Z
dc.date.issued2016-07-28
dc.identifier.citationDyksik , M , Motyka , M , Sęk , G , Misiewicz , J , Dallner , M , Hoefling , S & Kamp , M 2016 , ' Influence of carrier concentration on properties of InAs waveguide layers in interband cascade laser structures ' , Journal of Applied Physics , vol. 120 , no. 4 , 043104 . https://doi.org/10.1063/1.4958904en
dc.identifier.issn0021-8979
dc.identifier.otherPURE: 244566321
dc.identifier.otherPURE UUID: 49632600-4c6d-4d1f-ac82-23fc768fce00
dc.identifier.otherScopus: 84979784271
dc.identifier.otherWOS: 000382405400004
dc.identifier.urihttp://hdl.handle.net/10023/9214
dc.descriptionThe work has supported by the European Commission within the Project WideLase (No. 318798) of the 7-th Framework Programme and by the National Science Center of Poland by the Grant No. 2014/15/B/ST7/04663.en
dc.description.abstractWe present a characterization of doped InAs layers in interband cascade lasers exploiting the plasmon-enhanced waveguiding. Fast differential reflectance was employed in order to identify the plasma-edge frequency via the Berreman effect and shown as an advantageous method when compared to other types of measurements. The carrier concentration was then derived and compared with the nominal doping densities. The emission properties of the investigated structures were studied by means of photoluminescence (PL). Its full-width at half-maximum and integrated intensity were extracted from PL spectra and analyzed in the function of the doping density (carrier concentration). The PL linewidth was found to be independent of the carrier concentration indicating an insignificant contribution of doping to the structural properties deterioration. The PL intensity decay with the carrier concentration suggests being dominated by Auger recombination losses.
dc.format.extent6
dc.language.isoeng
dc.relation.ispartofJournal of Applied Physicsen
dc.rights© 2016, Publisher / the Authors. This work is made available online in accordance with the publisher’s policies. This is the author created, accepted version manuscript following peer review and may differ slightly from the final published version. The final published version of this work is available at http://dx.doi.org/10.1063/1.4958904en
dc.subjectQC Physicsen
dc.subjectT Technology (General)en
dc.subjectNDASen
dc.subject.lccQCen
dc.subject.lccT1en
dc.titleInfluence of carrier concentration on properties of InAs waveguide layers in interband cascade laser structuresen
dc.typeJournal articleen
dc.description.versionPostprinten
dc.contributor.institutionUniversity of St Andrews.School of Physics and Astronomyen
dc.contributor.institutionUniversity of St Andrews.Condensed Matter Physicsen
dc.identifier.doihttps://doi.org/10.1063/1.4958904
dc.description.statusPeer revieweden


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