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dc.contributor.authorWhite, S. C.
dc.contributor.authorSingh, U. R.
dc.contributor.authorWahl, P.
dc.identifier.citationWhite , S C , Singh , U R & Wahl , P 2011 , ' A stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fields ' , Review of Scientific Instruments , vol. 82 , no. 11 , 113708 .
dc.identifier.otherPURE: 24933081
dc.identifier.otherPURE UUID: 8edd450b-19fb-4981-a308-0ad646e26d2a
dc.identifier.otherWOS: 000297941100028
dc.identifier.otherScopus: 82555182692
dc.identifier.otherORCID: /0000-0002-8635-1519/work/46939646
dc.description.abstractWe have developed a measurement head for scanning tunneling microscopy (STM) and specifically for spectroscopic imaging STM which is optimized for high mechanical stiffness and good thermal conductivity by choice of material. The main components of the microscope head are made of sapphire. Sapphire has been chosen from several competing possibilities based on finite element modeling of the fundamental vibrational modes of the body. We demonstrate operation of the STM head in topographic imaging and tunneling spectroscopy at temperatures down to below 2 K.
dc.relation.ispartofReview of Scientific Instrumentsen
dc.rightsCopyright 2011, American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Review of Scientific Instruments, Vol 82, Issue 11, and may be found at:
dc.subjectScanning tunneling microscopyen
dc.subjectVibration testingen
dc.subjectVibration resonsonanceen
dc.titleA stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fieldsen
dc.typeJournal articleen
dc.description.versionPublisher PDFen
dc.contributor.institutionUniversity of St Andrews. School of Physics and Astronomyen
dc.contributor.institutionUniversity of St Andrews. Condensed Matter Physicsen
dc.description.statusPeer revieweden

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