A stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fields

White, S. C.; Singh, U. R.; Wahl, P.

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Date

11/2011

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Abstract

We have developed a measurement head for scanning tunneling microscopy (STM) and specifically for spectroscopic imaging STM which is optimized for high mechanical stiffness and good thermal conductivity by choice of material. The main components of the microscope head are made of sapphire. Sapphire has been chosen from several competing possibilities based on finite element modeling of the fundamental vibrational modes of the body. We demonstrate operation of the STM head in topographic imaging and tunneling spectroscopy at temperatures down to below 2 K.

Citation

White , S C , Singh , U R & Wahl , P 2011 , ' A stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fields ' , Review of Scientific Instruments , vol. 82 , no. 11 , 113708 . https://doi.org/10.1063/1.3663611

Publication

Review of Scientific Instruments

Status

Peer reviewed

DOI

https://doi.org/10.1063/1.3663611

ISSN

0034-6748

Type

Journal article

Rights

Copyright 2011, American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Review of Scientific Instruments, Vol 82, Issue 11, and may be found at: http://scitation.aip.org/content/aip/journal/rsi/82/11/10.1063/1.3663611

Collections

University of St Andrews Research

URI

http://hdl.handle.net/10023/4351