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dc.contributor.authorCardile, Paolo
dc.contributor.authorFranzo, Giorgia
dc.contributor.authorLo Savio, Roberto
dc.contributor.authorGalli, Matteo
dc.contributor.authorKrauss, Thomas Fraser
dc.contributor.authorPriolo, Francesco
dc.contributor.authorO'Faolain, Liam
dc.date.accessioned2014-01-10T10:31:08Z
dc.date.available2014-01-10T10:31:08Z
dc.date.issued2011-05
dc.identifier18002532
dc.identifiere0c74a5f-0bbc-4d13-ba0c-a1863999748b
dc.identifier79957538786
dc.identifier.citationCardile , P , Franzo , G , Lo Savio , R , Galli , M , Krauss , T F , Priolo , F & O'Faolain , L 2011 , ' Electrical conduction and optical properties of doped SOI Photonic Crystals ' , Applied Physics Letters , vol. 98 , no. 20 , 203506 . https://doi.org/10.1063/1.3580613en
dc.identifier.issn0003-6951
dc.identifier.urihttps://hdl.handle.net/10023/4343
dc.description.abstractWe investigate the electrical properties of silicon-on-insulator (SOI) photonic crystals as a function of both doping level and air filling factor. The resistance trends can be clearly explained by the presence of a depletion region around the sidewalls of the holes that is caused by band pinning at the surface. To understand the trade-off between the carrier transport and the optical losses due to free electrons in the doped SOI, we also measured the resonant modes of L3 photonic crystal nanocavities and found that surprisingly high doping levels, up to 10(18)/cm(3), are acceptable for practical devices with Q factors as high as 4×10(4).
dc.format.extent865976
dc.language.isoeng
dc.relation.ispartofApplied Physics Lettersen
dc.subjectDopingen
dc.subjectPhotonic crystalsen
dc.subjectElectrical resistivityen
dc.subjectPhotonic crystal devicesen
dc.titleElectrical conduction and optical properties of doped SOI Photonic Crystalsen
dc.typeJournal articleen
dc.contributor.sponsorEPSRCen
dc.contributor.institutionUniversity of St Andrews. School of Physics and Astronomyen
dc.contributor.institutionUniversity of St Andrews. Microphotonics and Photonic Crystals Groupen
dc.identifier.doihttps://doi.org/10.1063/1.3580613
dc.description.statusPeer revieweden
dc.identifier.grantnumberEP/H00680X/1en


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