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High-throughput speckle spectrometers based on multifractal scattering media
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dc.contributor.author | Kumar, Bhupesh | |
dc.contributor.author | Zhu, Yilin | |
dc.contributor.author | Dal Negro, Luca | |
dc.contributor.author | Schulz, Sebastian Andreas | |
dc.date.accessioned | 2024-03-15T10:30:27Z | |
dc.date.available | 2024-03-15T10:30:27Z | |
dc.date.issued | 2024-04-01 | |
dc.identifier | 298184284 | |
dc.identifier | 1749046e-8f94-4e04-ac5e-b426cd30ed8a | |
dc.identifier | 85190306632 | |
dc.identifier.citation | Kumar , B , Zhu , Y , Dal Negro , L & Schulz , S A 2024 , ' High-throughput speckle spectrometers based on multifractal scattering media ' , Optical Materials Express , vol. 14 , no. 4 , pp. 944-954 . https://doi.org/10.1364/OME.511275 | en |
dc.identifier.issn | 2159-3930 | |
dc.identifier.other | ORCID: /0000-0001-5169-0337/work/155626523 | |
dc.identifier.uri | https://hdl.handle.net/10023/29502 | |
dc.description | Funding: S. A. Schulz and B. Kumar acknowledge funding from the EPSRC project EP/V029975/1: "Disorder enhanced on-chip spectrometers". L.D.N. acknowledges support from the National Science Foundation (ECCS-2015700, ECCS-2110204)". | en |
dc.description.abstract | We present compact integrated speckle spectrometers based on monofractal and multifractal scattering media in a silicon-on-insulator platform. Through both numerical and experimental studies we demonstrate enhanced optical throughput, and hence signal-to-noise ratio, for a number of random structures with tailored multifractal geometries without affecting the spectral decay of the speckle correlation functions. Moreover, we show that the developed multifractal media outperform traditional scattering spectrometers based on uniform random distributions of scattering centers. Our findings establish the potential of low-density random media with multifractal correlations for integrated on-chip applications beyond what is possible with uncorrelated random disorder. | |
dc.format.extent | 4134963 | |
dc.language.iso | eng | |
dc.relation.ispartof | Optical Materials Express | en |
dc.subject | QC Physics | en |
dc.subject | DAS | en |
dc.subject.lcc | QC | en |
dc.title | High-throughput speckle spectrometers based on multifractal scattering media | en |
dc.type | Journal article | en |
dc.contributor.sponsor | EPSRC | en |
dc.contributor.institution | University of St Andrews. School of Physics and Astronomy | en |
dc.identifier.doi | https://doi.org/10.1364/OME.511275 | |
dc.description.status | Peer reviewed | en |
dc.identifier.grantnumber | EP/V029975/1 | en |
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