High-throughput speckle spectrometers based on multifractal scattering media
Abstract
We present compact integrated speckle spectrometers based on monofractal and multifractal scattering media in a silicon-on-insulator platform. Through both numerical and experimental studies we demonstrate enhanced optical throughput, and hence signal-to-noise ratio, for a number of random structures with tailored multifractal geometries without affecting the spectral decay of the speckle correlation functions. Moreover, we show that the developed multifractal media outperform traditional scattering spectrometers based on uniform random distributions of scattering centers. Our findings establish the potential of low-density random media with multifractal correlations for integrated on-chip applications beyond what is possible with uncorrelated random disorder.
Citation
Kumar , B , Zhu , Y , Dal Negro , L & Schulz , S A 2024 , ' High-throughput speckle spectrometers based on multifractal scattering media ' , Optical Materials Express , vol. 14 , no. 4 , pp. 944-954 . https://doi.org/10.1364/OME.511275
Publication
Optical Materials Express
Status
Peer reviewed
ISSN
2159-3930Type
Journal article
Description
Funding: S. A. Schulz and B. Kumar acknowledge funding from the EPSRC project EP/V029975/1: "Disorder enhanced on-chip spectrometers". L.D.N. acknowledges support from the National Science Foundation (ECCS-2015700, ECCS-2110204)".Collections
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