Tight focusing with a binary microaxicon

Kotlyar, Victor V; Stafeev, S S; O'Faolain, Liam; Soifer, V A

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dc.contributor.author	Kotlyar, Victor V
dc.contributor.author	Stafeev, S S
dc.contributor.author	O'Faolain, Liam
dc.contributor.author	Soifer, V A
dc.date.accessioned	2012-06-28T15:01:03Z
dc.date.available	2012-06-28T15:01:03Z
dc.date.issued	2011-08-15
dc.identifier.citation	Kotlyar , V V , Stafeev , S S , O'Faolain , L & Soifer , V A 2011 , ' Tight focusing with a binary microaxicon ' , Optics Letters , vol. 36 , no. 16 , pp. 3100-3102 . https://doi.org/10.1364/OL.36.003100	en
dc.identifier.issn	0146-9592
dc.identifier.other	PURE: 18003053
dc.identifier.other	PURE UUID: 43bfea4d-6f06-48c3-985e-0fa374324bb4
dc.identifier.other	Scopus: 80051757991
dc.identifier.other	WOS: 000293890800029
dc.identifier.uri	https://hdl.handle.net/10023/2873
dc.description.abstract	Using a near-field scanning microscope (NT-MDT) with a 100nm aperture cantilever held 1 μm apart from a microaxicon of diameter 14 μm and period 800nm, we measure a focal spot resulting from the illumination by a linearly polarized laser light of wavelength λ ¼ 532nm, with itsFWHMbeing equal to 0:58λ, and the depth of focus being 5:6λ. The rms deviation of the focal spot intensity from the calculated value is 6%. The focus intensity is five times larger than the maximal illumination beam intensity.
dc.language.iso	eng
dc.relation.ispartof	Optics Letters	en
dc.rights	© 2011 Optical Society of America	en
dc.subject	QC Physics	en
dc.subject.lcc	QC	en
dc.title	Tight focusing with a binary microaxicon	en
dc.type	Journal article	en
dc.contributor.sponsor	EPSRC	en
dc.description.version	Publisher PDF	en
dc.contributor.institution	University of St Andrews. School of Physics and Astronomy	en
dc.contributor.institution	University of St Andrews. Microphotonics and Photonic Crystals Group	en
dc.identifier.doi	https://doi.org/10.1364/OL.36.003100
dc.description.status	Peer reviewed	en
dc.identifier.grantnumber	EP/H00680X/1	en

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