Tight focusing with a binary microaxicon
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Using a near-field scanning microscope (NT-MDT) with a 100nm aperture cantilever held 1 μm apart from a microaxicon of diameter 14 μm and period 800nm, we measure a focal spot resulting from the illumination by a linearly polarized laser light of wavelength λ ¼ 532nm, with itsFWHMbeing equal to 0:58λ, and the depth of focus being 5:6λ. The rms deviation of the focal spot intensity from the calculated value is 6%. The focus intensity is five times larger than the maximal illumination beam intensity.
Kotlyar , V V , Stafeev , S S , O'Faolain , L & Soifer , V A 2011 , ' Tight focusing with a binary microaxicon ' Optics Letters , vol 36 , no. 16 , pp. 3100-3102 . DOI: 10.1364/OL.36.003100
© 2011 Optical Society of America
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