High quality factor GaAs microcavity with buried bullseye defects
Abstract
The development of high quality factor solid-state microcavities with low mode volumes has paved the way towards on-chip cavity quantum electrodynamics experiments and the development of high-performance nanophotonic devices. Here, we report on the implementation of a new kind of solid-state vertical microcavity, which allows for confinement of the electromagnetic field in the lateral direction without deep etching. The confinement originates from a local elongation of the cavity layer imprinted in a shallow etch and epitaxial overgrowth technique. We show that it is possible to improve the quality factor of such microcavities by a specific in-plane bullseye geometry consisting of a set of concentric rings with sub wavelength dimensions. This design results in a smooth effective lateral photonic potential and therefore in a reduction of lateral scattering losses, which makes it highly appealing for experiments in the framework of exciton-polariton physics demanding tight spatial confinement.
Citation
Winkler , K , Gregersen , N , Häyrynen , T , Bradel , B , Schade , A , Emmerling , M , Kamp , M , Höfling , S & Schneider , C 2018 , ' High quality factor GaAs microcavity with buried bullseye defects ' , Physical Review Materials , vol. 2 , no. 5 , 05220(R) . https://doi.org/10.1103/PhysRevMaterials.2.052201
Publication
Physical Review Materials
Status
Peer reviewed
ISSN
2475-9953Type
Journal article
Description
The authors acknowledge financial support from the State of Bavaria, as well as from the DFG within the Project Schn1376/3.1: Polariton based single-photon sources, and from the Danish Research Council for Technology and Production (Sapere Aude LOQIT, DFF4005-00370).Collections
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