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dc.contributor.authorCollins-McIntyre, L. J.
dc.contributor.authorDuffy, L. B.
dc.contributor.authorSingh, A.
dc.contributor.authorSteinke, N. -J.
dc.contributor.authorKinane, C. J.
dc.contributor.authorCharlton, T. R.
dc.contributor.authorPushp, A.
dc.contributor.authorKellock, A. J.
dc.contributor.authorParkin, S. S. P.
dc.contributor.authorHolmes, S. N.
dc.contributor.authorBarnes, C. H. W.
dc.contributor.authorvan der Laan, G.
dc.contributor.authorLangridge, S.
dc.contributor.authorHesjedal, T.
dc.date.accessioned2016-09-26T09:30:18Z
dc.date.available2016-09-26T09:30:18Z
dc.date.issued2016-08-22
dc.identifier.citationCollins-McIntyre , L J , Duffy , L B , Singh , A , Steinke , N -J , Kinane , C J , Charlton , T R , Pushp , A , Kellock , A J , Parkin , S S P , Holmes , S N , Barnes , C H W , van der Laan , G , Langridge , S & Hesjedal , T 2016 , ' Structural, electronic, and magnetic investigation of magnetic ordering in MBE-grown Cr x Sb 2-x Te 3 thin films ' , EPL , vol. 115 , no. 2 , 27006 . https://doi.org/10.1209/0295-5075/115/27006en
dc.identifier.issn0295-5075
dc.identifier.otherPURE: 246090684
dc.identifier.otherPURE UUID: ccf48456-dc06-4028-bc65-7998a1afb29f
dc.identifier.otherScopus: 84986197852
dc.identifier.urihttps://hdl.handle.net/10023/9551
dc.descriptionThis work arises from research funded by the John Fell Oxford University Press Research Fund. LJC-M and LBD acknowledge financial support from EPSRC. LBD acknowledges financial support from the Science and Technology Facilities Council (UK) and AS from the Cambridge Commonwealth Trust.en
dc.description.abstractWe report the structural, electronic, and magnetic study of Cr-doped Sb2Te3 thin films grown by a two-step deposition process using molecular-beam epitaxy (MBE). The samples were investigated using a variety of complementary techniques, namely, x-ray diffraction (XRD), atomic force microscopy, SQUID magnetometry, magneto-transport, and polarized neutron reflectometry (PNR). It is found that the samples retain good crystalline order up to a doping level of x = 0.42 (in CrxSb2-xTe3), above which degradation of the crystal structure is observed by XRD. Fits to the recorded XRD spectra indicate a general reduction in the c-axis lattice parameter as a function of doping, consistent with substitutional doping with an ion of smaller ionic radius. The samples show soft ferromagnetic behavior with the easy axis of magnetization being out-of-plane. The saturation magnetization is dependent on the doping level, and reaches from ~2 μBto almost 3 μB per Cr ion. The transition temperature (Tc) depends strongly on the Cr concentration and is found to increase with doping concentration. For the highest achievable doping level for phase-pure films of x = 0.42 ,a Tc of 125 K was determined. Electric transport measurements find surface-dominated transport below ∼10 K. The magnetic properties extracted from anomalous Hall effect data are in excellent agreement with the magnetometry data. PNR studies indicate a uniform magnetization profile throughout the film, with no indication of enhanced magnetic order towards the sample surface.
dc.format.extent7
dc.language.isoeng
dc.relation.ispartofEPLen
dc.rights© EPLA, 2016. Published by the EPLA under the terms of the Creative Commons Attribution 3.0 License (CC-BY). Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.en
dc.subjectQC Physicsen
dc.subjectPhysics and Astronomy(all)en
dc.subjectT-NDASen
dc.subject.lccQCen
dc.titleStructural, electronic, and magnetic investigation of magnetic ordering in MBE-grown CrxSb2-xTe3 thin filmsen
dc.typeJournal articleen
dc.description.versionPublisher PDFen
dc.contributor.institutionUniversity of St Andrews. School of Physics and Astronomyen
dc.identifier.doihttps://doi.org/10.1209/0295-5075/115/27006
dc.description.statusPeer revieweden


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