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A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping
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dc.contributor.author | Whitley, William | |
dc.contributor.author | Stock, Chris | |
dc.contributor.author | Huxley, Andrew D. | |
dc.date.accessioned | 2016-05-24T16:30:05Z | |
dc.date.available | 2016-05-24T16:30:05Z | |
dc.date.issued | 2015-08 | |
dc.identifier | 242923701 | |
dc.identifier | 96203a9d-0a84-4978-8e7c-6f9ca5b06e45 | |
dc.identifier | 000358791900040 | |
dc.identifier | 84938403676 | |
dc.identifier.citation | Whitley , W , Stock , C & Huxley , A D 2015 , ' A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping ' , Journal of Applied Crystallography , vol. 48 , pp. 1342-1345 . https://doi.org/10.1107/S1600576715009097 | en |
dc.identifier.issn | 1600-5767 | |
dc.identifier.uri | https://hdl.handle.net/10023/8862 | |
dc.description.abstract | Although CCD X-ray detectors can be faster to use, their large-area versions can be much more expensive than similarly sized photographic plate detectors. When indexing X-ray diffraction patterns, large-area detectors can prove very advantageous as they provide more spots, which makes fitting an orientation easier. On the other hand, when looking for single crystals in a polycrystalline sample, the speed of CCD detectors is more useful. A new setup is described here which overcomes some of the limitations of limited-range CCD detectors to make them more useful for indexing, whilst at the same time making it much quicker to find single crystals within a larger polycrystalline structure. This was done by combining a CCD detector with a six-axis goniometer, allowing the compilation of images from different angles into a wide-angled image. Automated scans along the sample were coupled with image processing techniques to produce grain maps, which can then be used to provide a strategy to extract single crystals from a polycrystal. | |
dc.format.extent | 4 | |
dc.format.extent | 642350 | |
dc.language.iso | eng | |
dc.relation.ispartof | Journal of Applied Crystallography | en |
dc.subject | laboratory-based Laue X-ray diffraction | en |
dc.subject | Grain mapping | en |
dc.subject | QC Physics | en |
dc.subject | NDAS | en |
dc.subject.lcc | QC | en |
dc.title | A laboratory-based Laue X-ray diffraction system for enhanced imaging range and surface grain mapping | en |
dc.type | Journal article | en |
dc.contributor.sponsor | EPSRC | en |
dc.contributor.institution | University of St Andrews. School of Physics and Astronomy | en |
dc.contributor.institution | University of St Andrews. Condensed Matter Physics | en |
dc.identifier.doi | 10.1107/S1600576715009097 | |
dc.description.status | Peer reviewed | en |
dc.identifier.grantnumber | EP/I031014/1 | en |
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