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dc.contributor.authorZhang, Yong-hui
dc.contributor.authorWahl, Peter
dc.contributor.authorKern, Klaus
dc.identifier.citationZhang , Y , Wahl , P & Kern , K 2013 , ' Experimental visualization of scattering at defects in electronic transport through a single atomic junction ' , Physical Review. B, Condensed matter and materials physics , vol. 87 , no. 20 , 205417 .
dc.identifier.otherPURE: 54630563
dc.identifier.otherPURE UUID: c1e7ed77-9d33-4abe-b214-5937cf990d24
dc.identifier.otherScopus: 84877883147
dc.identifier.otherWOS: 000318810300007
dc.identifier.otherORCID: /0000-0002-8635-1519/work/46939644
dc.descriptionFunding: Chinese Scholarship Councilen
dc.description.abstractFor electronic transport at the nanoscale, coherent scattering at defects plays an important role. Therefore, the capability of visualizing the influence of defects on the conductivity of single atomic junctions may benefit the development of future nano-electronics. Here, we report imaging the coherent scattering from a defect with well-controlled geometry by quantum point contact microscopy recently developed by us. An ∼10% modulation in transport conductance of a single atomic junction is observed, with a phase shift of nearly π compared to the tunneling conductance. With the well-defined scattering geometry, we performed a theoretical calculation of the conductance and found the result consistent with the experiment.
dc.relation.ispartofPhysical Review. B, Condensed matter and materials physicsen
dc.rights© 2013. American Physical Society.en
dc.subjectQC Physicsen
dc.titleExperimental visualization of scattering at defects in electronic transport through a single atomic junctionen
dc.typeJournal articleen
dc.description.versionPublisher PDFen
dc.contributor.institutionUniversity of St Andrews. School of Physics and Astronomyen
dc.contributor.institutionUniversity of St Andrews. Condensed Matter Physicsen
dc.description.statusPeer revieweden

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