Random super-prism wavelength meter
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Date
01/01/2014Grant ID
EP/I004602/1
EP/J01771X/1
EP/J004200/1
Metadata
Show full item recordAbstract
The speckle pattern arising from a thin random, disordered scatterer may be used to detect the transversal mode of an incident beam. On the other hand, speckle patterns originating from meter-long multimode fibers can be used to detect different wavelengths. Combining these approaches, we develop a method that uses a thin random scattering medium to measure the wavelength of a near-infrared laser beam with picometer resolution. The method is based on the application of principal component analysis, which is used for pattern recognition and is applied here to the case of speckle pattern categorization.
Citation
Mazilu , M , Vettenburg , T , Di Falco , A & Dholakia , K 2014 , ' Random super-prism wavelength meter ' , Optics Letters , vol. 39 , no. 1 , pp. 96-99 . https://doi.org/10.1364/OL.39.000096
Publication
Optics Letters
Status
Peer reviewed
ISSN
0146-9592Type
Journal article
Rights
© 2014 Optical Society of America
Description
The authors acknowledge the UK Engineering and Physical Sciences Research Council for funding (EP/J004200/1). ADF is a EPSRC fellow (EP/I004602/1). Kishan Dholakia is a Royal Society-Wolfson Merit Award Holder.Collections
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