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dc.contributor.authorHolsgrove, Kristina M.
dc.contributor.authorDuchamp, Martial
dc.contributor.authorMoreno, M. Sergio
dc.contributor.authorBernier, Nicolas
dc.contributor.authorNaden, Aaron B.
dc.contributor.authorGuy, Joseph G. M.
dc.contributor.authorBrowne, Niall
dc.contributor.authorGupta, Arunava
dc.contributor.authorGregg, J. Marty
dc.contributor.authorKumar, Amit
dc.contributor.authorArredondo, Miryam
dc.date.accessioned2020-08-24T14:30:06Z
dc.date.available2020-08-24T14:30:06Z
dc.date.issued2020-07-27
dc.identifier.citationHolsgrove , K M , Duchamp , M , Moreno , M S , Bernier , N , Naden , A B , Guy , J G M , Browne , N , Gupta , A , Gregg , J M , Kumar , A & Arredondo , M 2020 , ' Elastic distortion determining conduction in BiFeO 3 phase boundaries ' , RSC Advances , vol. 10 , no. 47 , pp. 27954-27960 . https://doi.org/10.1039/d0ra04358cen
dc.identifier.issn2046-2069
dc.identifier.otherPURE: 269766314
dc.identifier.otherPURE UUID: 4df91980-50f7-4fcc-928b-41cbc9ee9683
dc.identifier.otherWOS: 000556432400008
dc.identifier.otherScopus: 85091703317
dc.identifier.otherORCID: /0000-0003-2876-6991/work/110912163
dc.identifier.urihttp://hdl.handle.net/10023/20508
dc.descriptionK. M. H. and M. A. would like to acknowledge support from the EPSRC through grant no. 1357612. A. K. would like to acknowledge EPSRC support through grant no. EP/N018389/1. K. M. H. and M. A. would like to acknowledge support from ESTEEM2 for funding the experiments carried out at ER-C, Juelich.en
dc.description.abstractIt is now well-established that boundaries separating tetragonal-like (T) and rhombohedral-like (R) phases in BiFeO3 thin films can show enhanced electrical conductivity. However, the origin of this conductivity remains elusive. Here, we study mixed-phase BiFeO3 thin films, where local populations of T and R can be readily altered using stress and electric fields. We observe that phase boundary electrical conductivity in regions which have undergone stress-writing is significantly greater than in the virgin microstructure. We use high-end electron microscopy techniques to identify key differences between the R–T boundaries present in stress-written and as-grown microstructures, to gain a better understanding of the mechanism responsible for electrical conduction. We find that point defects (and associated mixed valence states) are present in both electrically conducting and non-conducting regions; crucially, in both cases, the spatial distribution of defects is relatively homogeneous: there is no evidence of phase boundary defect aggregation. Atomic resolution imaging reveals that the only significant difference between non-conducting and conducting boundaries is the elastic distortion evident – detailed analysis of localised crystallography shows that the strain accommodation across the R–T boundaries is much more extensive in stress-written than in as-grown microstructures; this has a substantial effect on the straightening of local bonds within regions seen to electrically conduct. This work therefore offers distinct evidence that the elastic distortion is more important than point defect accumulation in determining the phase boundary conduction properties in mixed-phase BiFeO3.
dc.format.extent7
dc.language.isoeng
dc.relation.ispartofRSC Advancesen
dc.rightsCopyright © 2020 The Author(s). Open Access article. This article is licensed under a Creative Commons Attribution 3.0 Unported Licence.en
dc.subjectQD Chemistryen
dc.subjectQC Physicsen
dc.subjectNDASen
dc.subject.lccQDen
dc.subject.lccQCen
dc.titleElastic distortion determining conduction in BiFeO3 phase boundariesen
dc.typeJournal articleen
dc.description.versionPublisher PDFen
dc.contributor.institutionUniversity of St Andrews. School of Chemistryen
dc.identifier.doihttps://doi.org/10.1039/d0ra04358c
dc.description.statusPeer revieweden


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