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Characterisation of size distribution and positional misalignment of nanoscale islands by small-angle X-ray scattering

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dc.contributor.authorHeldt, Georg
dc.contributor.authorThompson, Philip
dc.contributor.authorChopdekar, Rajesh V.
dc.contributor.authorKohlbrecher, Joachim
dc.contributor.authorLee, Stephen
dc.contributor.authorHeyderman, Laura J.
dc.contributor.authorThomson, Thomas
dc.date.accessioned2019-01-23T10:30:10Z
dc.date.available2019-01-23T10:30:10Z
dc.date.issued2019-01-02
dc.identifier257462738
dc.identifierd6c91ee2-6443-4f79-b7e9-01d46235f5ed
dc.identifier000455350200011
dc.identifier85059616140
dc.identifier000455350200011
dc.identifier.citationHeldt , G , Thompson , P , Chopdekar , R V , Kohlbrecher , J , Lee , S , Heyderman , L J & Thomson , T 2019 , ' Characterisation of size distribution and positional misalignment of nanoscale islands by small-angle X-ray scattering ' , Journal of Applied Physics , vol. 125 , no. 1 , 014301 . https://doi.org/10.1063/1.5050882en
dc.identifier.issn0021-8979
dc.identifier.otherORCID: /0000-0002-2020-3310/work/54995386
dc.identifier.urihttps://hdl.handle.net/10023/16922
dc.descriptionThe authors gratefully acknowledge the contribution of the Engineering and Physical Sciences Research Council (EPSRC) (Grant No. EP/G032440/1) toward funding this work.en
dc.description.abstractHighly ordered arrays of nanoscale magnetic structures form the basis of artificial spin ices, uniform particles for bio-medical applications, and data storage as Bit Patterned Media. We demonstrate that small-angle X-ray scattering (SAXS) allows the size distribution and the positional alignment of highly ordered arrays to be determined with high spatial and statistical accuracy. The results obtained from the SAXS measurements are compared to an analysis of Scanning Electron Microscopy images and found to be in excellent agreement. This confirms the validity of the technique and demonstrates its potential as a fast, accurate, and statistically reliable method for characterising arrays of ordered nanostructures.
dc.format.extent8
dc.format.extent2262820
dc.language.isoeng
dc.relation.ispartofJournal of Applied Physicsen
dc.subjectQA75 Electronic computers. Computer scienceen
dc.subjectQC Physicsen
dc.subjectNDASen
dc.subject.lccQA75en
dc.subject.lccQCen
dc.titleCharacterisation of size distribution and positional misalignment of nanoscale islands by small-angle X-ray scatteringen
dc.typeJournal articleen
dc.contributor.sponsorEPSRCen
dc.contributor.sponsorEPSRCen
dc.contributor.sponsorEPSRCen
dc.contributor.institutionUniversity of St Andrews. School of Physics and Astronomyen
dc.contributor.institutionUniversity of St Andrews. Condensed Matter Physicsen
dc.contributor.institutionUniversity of St Andrews. Centre for Designer Quantum Materialsen
dc.identifier.doi10.1063/1.5050882
dc.description.statusPeer revieweden
dc.identifier.grantnumberEP/E064264/1en
dc.identifier.grantnumberEP/J01060X/1en
dc.identifier.grantnumberEP/R031924/1en


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