Show simple item record

Files in this item

Thumbnail

Item metadata

dc.contributor.authorSmith, Eva H.
dc.contributor.authorKing, Phil D. C.
dc.contributor.authorSoukiassian, Arsen
dc.contributor.authorAst, Dieter G.
dc.contributor.authorSchlom, Darrell G.
dc.date.accessioned2018-09-28T23:44:41Z
dc.date.available2018-09-28T23:44:41Z
dc.date.issued2017-09-29
dc.identifier.citationSmith , E H , King , P D C , Soukiassian , A , Ast , D G & Schlom , D G 2017 , ' Hybrid reflections from multiple x-ray scattering in epitaxial oxide films ' , Applied Physics Letters , vol. 111 , no. 13 , 131903 . https://doi.org/10.1063/1.4993477en
dc.identifier.issn0003-6951
dc.identifier.otherPURE: 251389188
dc.identifier.otherPURE UUID: 4474e210-df6d-4a3b-b51f-420ba0caf644
dc.identifier.otherScopus: 85030464191
dc.identifier.otherWOS: 000412074000008
dc.identifier.urihttp://hdl.handle.net/10023/16108
dc.descriptionE.H.S. and D.G.S. acknowledge support by the National Science Foundation (NSF) MRSEC program (DMR-1420620).en
dc.description.abstractIn numerous symmetric θ-2θ scans of phase-pure epitaxial complex oxide thin films grown on single-crystal substrates, we observe x-ray diffraction peaks that correspond to neither the film nor the substrate crystal structure. These peaks are the result of multiple, sequential diffraction events that occur from both the film and the substrate. The occurrence of so-called "hybrid" reflections, while described in the literature, is not widely reported within the complex oxide thin-film community. We describe a simple method to predict and identify peaks resulting from hybrid reflections and show examples from epitaxial complex oxide films belonging to three distinct structural types.
dc.language.isoeng
dc.relation.ispartofApplied Physics Lettersen
dc.rights© 2017 The Authors. Published by AIP Publishing. This work is made available online in accordance with the publisher’s policies. This is the final published version of the work, which was originally published at: https://doi.org/10.1063/1.4993477en
dc.subjectQC Physicsen
dc.subjectPhysics and Astronomy (miscellaneous)en
dc.subjectNDASen
dc.subject.lccQCen
dc.titleHybrid reflections from multiple x-ray scattering in epitaxial oxide filmsen
dc.typeJournal articleen
dc.description.versionPublisher PDFen
dc.contributor.institutionUniversity of St Andrews.School of Physics and Astronomyen
dc.contributor.institutionUniversity of St Andrews.Condensed Matter Physicsen
dc.identifier.doihttps://doi.org/10.1063/1.4993477
dc.description.statusPeer revieweden
dc.date.embargoedUntil2018-09-29


This item appears in the following Collection(s)

Show simple item record