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| Title: | Tight focusing with a binary microaxicon |
| Authors: | Kotlyar, Victor V
Stafeev, S S
O'Faolain, Liam
Soifer, V A |
| Keywords: | QC Physics |
| Issue Date: | 15-Aug-2011 |
| Citation: | Kotlyar , V V , Stafeev , S S , O'Faolain , L & Soifer , V A 2011 , ' Tight focusing with a binary microaxicon ' Optics Letters , vol 36 , no. 16 , pp. 3100-3102 . |
| Abstract: | Using a near-field scanning microscope (NT-MDT) with a 100nm aperture cantilever held 1 μm apart from a microaxicon of diameter 14 μm and period 800nm, we measure a focal spot resulting from the illumination by a linearly polarized laser light of wavelength λ ¼ 532nm, with itsFWHMbeing equal to 0:58λ, and the depth of focus being 5:6λ. The rms deviation of the focal spot intensity from the calculated value is 6%. The focus intensity is five times larger than the maximal illumination beam intensity. |
| Version: | Publisher PDF |
| Status: | Peer reviewed |
| URI: | http://hdl.handle.net/10023/2873 |
| DOI: | http://dx.doi.org/10.1364/OL.36.003100 |
| ISSN: | 0146-9592 |
| Type: | Journal article |
| Rights: | © 2011 Optical Society of America |
| Appears in Collections: | University of St Andrews Research
Physics & Astronomy Research
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