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Please use this identifier to cite or link to this item: http://hdl.handle.net/10023/2873
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Title: Tight focusing with a binary microaxicon
Authors: Kotlyar, Victor V
Stafeev, S S
O'Faolain, Liam
Soifer, V A
Keywords: QC Physics
Issue Date: 15-Aug-2011
Citation: Kotlyar , V V , Stafeev , S S , O'Faolain , L & Soifer , V A 2011 , ' Tight focusing with a binary microaxicon ' Optics Letters , vol 36 , no. 16 , pp. 3100-3102 .
Abstract: Using a near-field scanning microscope (NT-MDT) with a 100nm aperture cantilever held 1 μm apart from a microaxicon of diameter 14 μm and period 800nm, we measure a focal spot resulting from the illumination by a linearly polarized laser light of wavelength λ ¼ 532nm, with itsFWHMbeing equal to 0:58λ, and the depth of focus being 5:6λ. The rms deviation of the focal spot intensity from the calculated value is 6%. The focus intensity is five times larger than the maximal illumination beam intensity.
Version: Publisher PDF
Status: Peer reviewed
URI: http://hdl.handle.net/10023/2873
DOI: http://dx.doi.org/10.1364/OL.36.003100
ISSN: 0146-9592
Type: Journal article
Rights: © 2011 Optical Society of America
Appears in Collections:University of St Andrews Research
Physics & Astronomy Research



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